"RAYON X"@fr . "Electronic structure"@en . "Conduction bands"@en . "AUTOREPARATION"@fr . "Chemical elements"@en . "SURVEILLANCE"@fr . "Bragg Mirrors"@en . "Coherent scattering"@en . "Perovskites"@en . "Optical properties"@en . "MODULE D'ELASTICITE"@fr . "Crystallography"@en . "Ultrasound"@en . "Microtwins"@en . "CHLORURE"@fr . "Antiphase defects"@en . "Photoluminescence"@en . "MODELISATION"@fr . . "Optique non-lin\u00E9aire"@fr . "Ultrasonic for seismic"@en . . . "III-V semiconductors"@en . "Drift\u2013diffusion"@en . "ONDE"@fr . "GaP"@fr . "Planar defects"@en . . "MODELISATION PHYSIQUE"@fr . "Tight-binding model"@en . . "Concrete"@en . "POROSITE"@fr . "Energy efficiency"@en . "Numerical simulation"@en . "Photonics on silicon"@en . "EPAISSEUR"@fr . . "Semiconducteurs III-V"@fr . "ULTRASON"@fr . . "DFT"@en . "Ambient temperature"@en . "Electronic bandstructure"@en . "Electroluminescence and photoluminescence"@en . "COUCHE DE CHAUSSEE"@fr . "2D vertical homovalent singularity"@en . "Deposition processes"@en . "CONTROLE NON DESTRUCTIF"@fr . "MICROTOMOGRAPHIE"@fr . . "SPV"@en . "Hetero-structures"@en . "Copper indium gallium selenide"@en . . "Effective medium"@en . "Olivier" . . "Activation energies"@en . "Epitaxy"@en . . "Tunnel junction"@en . . "Crystals"@en . . "MESURE"@fr . . "Tunable Lasers"@en . . "TENEUR EN EAU"@fr . "METHODE SISMIQUE"@fr . "Optique int\u00E9gr\u00E9e sur Si"@fr . "VAGUE"@fr . "Control theory"@en . "Characterization"@en . "DIFFUSION"@fr . "Fils quantiques"@fr . "BETON"@fr . "Acoustic methods"@en . "IMAGERIE 3D"@fr . "Signal processing"@en . "Band structure"@en . "Olivier Durand" . "Electron\u2212phonon interaction"@en . "Crystal growth"@en . "Vertical-cavity surface-emitting laser"@en . "Semiconductors"@en . "Band models"@en . "Acoustical effects"@en . "Molecular beam epitaxy"@en . "Laser"@en . "Crystallinity"@en . "Multijunction solar cells"@en . "Time-resolved photoluminescence"@en . "Si"@en . "Diluted-nitride alloy"@en . "MODELE NON LINEAIRE"@fr . "Quantum wells"@en . "FISSURE"@fr . "Ab initio calculations"@en . "Drift diffusion simulation"@en . . "Halide perovskite"@en . "KPFM"@en . . "Croissance MBE"@fr . "Dilute nitride"@en . "Photovoltaics"@en . "Carrier confinement"@en . "RADAR"@fr . "Quantum wires"@en . "Damage assessment"@en . "Ellipsometry"@en . "SANTE"@fr . "Charge recombination"@en . "Ultrasonic wave speed"@en . "Synchrotron"@en . "Dielectric confinement"@en . "Vertical cavity surface emitting laser"@en . "X-ray diffraction"@en . . . "VCSEL"@fr . . "Distributed Bragg reflectors"@en . "Accordable"@fr . "X-ray scattering"@en . "Dielectric"@en . . "54777e432186243de3e2d13241fc43da" . <0000-0002-4956-7767> . "Durand" . <159510996> . . . "Crack formation"@en . "Hybrid perovskite"@en . "Silicon"@en . "ONDE ELECTROMAGNETIQUE"@fr . "Electrons"@en . "Electron-phonon interaction"@en . "Characterisation"@en . "Quantum dots"@en . "Antiphase domains"@en . "VITESSE"@fr . "MICROSCOPIE"@fr . "CIGS"@en . "Photonique"@fr . "BETON ARME"@fr . "Tunnel junctions"@en . . "Solar cells"@en . "Cracks"@en . "Microresonateurs"@fr . . "Liquid crystal device"@fr . "Quantum dashes"@en . "Electron microscopy"@en . "Tandem solar cells"@en . . "Polarisation"@fr . "Civil engineering SHM applications"@en . . "Elastic constants"@en . . "3D microscopy"@en . "Wave functions"@en . "GEOPHYSIQUE"@fr . . "Carrier dynamics"@en . . "Band gap"@en . "Bonding"@en . "Semiconductor lasers"@en . "Silicium"@fr . "Optical communications"@en .