"Electrons"@en . . <159510996> . . <0000-0002-4956-7767> . "Ambient temperature"@en . "Elastic constants"@en . "Ellipsometry"@en . . "Hetero-structures"@en . "X-ray diffraction"@en . "Civil engineering SHM applications"@en . "Croissance MBE"@fr . . . "SANTE"@fr . "Accordable"@fr . "CIGS"@en . "Si"@en . . "Band gap"@en . . "Microresonateurs"@fr . "Silicon"@en . "Durand" . "Olivier Durand" . "Diluted-nitride alloy"@en . "Time-resolved photoluminescence"@en . "Halide perovskite"@en . "Olivier" . "Drift diffusion simulation"@en . "Carrier confinement"@en . "ULTRASON"@fr . "III-V semiconductors"@en . "MICROSCOPIE"@fr . "Tunnel junctions"@en . "Damage assessment"@en . "Band structure"@en . "Hybrid perovskite"@en . "EPAISSEUR"@fr . "Crystals"@en . "Synchrotron"@en . "GaP"@fr . "Coherent scattering"@en . "Crystallography"@en . "Multijunction solar cells"@en . "Laser"@en . "BETON"@fr . "Crack formation"@en . "Tight-binding model"@en . "Liquid crystal device"@fr . "Activation energies"@en . "Electronic structure"@en . "RADAR"@fr . "Bragg Mirrors"@en . "VITESSE"@fr . "Acoustical effects"@en . "VCSEL"@fr . "Ultrasound"@en . "Electroluminescence and photoluminescence"@en . . "Effective medium"@en . "Ab initio calculations"@en . "METHODE SISMIQUE"@fr . . "Fils quantiques"@fr . "MESURE"@fr . "Quantum dashes"@en . "Tunable Lasers"@en . "Semiconductor lasers"@en . "Copper indium gallium selenide"@en . "Bonding"@en . "Electronic bandstructure"@en . "Wave functions"@en . "Antiphase defects"@en . "Acoustic methods"@en . "Electron\u2212phonon interaction"@en . "Optical communications"@en . "Optique int\u00E9gr\u00E9e sur Si"@fr . "SPV"@en . "FISSURE"@fr . "CHLORURE"@fr . "Distributed Bragg reflectors"@en . "Photonique"@fr . "Polarisation"@fr . "Silicium"@fr . "Band models"@en . "Dielectric"@en . "Tandem solar cells"@en . "ONDE"@fr . "Crystal growth"@en . "Dilute nitride"@en . "MODELISATION PHYSIQUE"@fr . "Vertical-cavity surface-emitting laser"@en . "Energy efficiency"@en . "Control theory"@en . "AUTOREPARATION"@fr . . "Planar defects"@en . "Quantum wires"@en . "RAYON X"@fr . "Tunnel junction"@en . "Optique non-lin\u00E9aire"@fr . "Perovskites"@en . . "Charge recombination"@en . "COUCHE DE CHAUSSEE"@fr . "Carrier dynamics"@en . "SURVEILLANCE"@fr . "Electron-phonon interaction"@en . . "Microtwins"@en . "DIFFUSION"@fr . "Vertical cavity surface emitting laser"@en . "Epitaxy"@en . "IMAGERIE 3D"@fr . "Drift\u2013diffusion"@en . "Dielectric confinement"@en . "POROSITE"@fr . "Characterisation"@en . "KPFM"@en . . . "VAGUE"@fr . . . "Cracks"@en . "ONDE ELECTROMAGNETIQUE"@fr . "54777e432186243de3e2d13241fc43da" . "Solar cells"@en . "Ultrasonic wave speed"@en . "Electron microscopy"@en . "MICROTOMOGRAPHIE"@fr . "Photovoltaics"@en . "Signal processing"@en . "DFT"@en . . "GEOPHYSIQUE"@fr . "Quantum dots"@en . . "Antiphase domains"@en . . "Quantum wells"@en . "Photoluminescence"@en . "3D microscopy"@en . "CONTROLE NON DESTRUCTIF"@fr . "Photonics on silicon"@en . "MODELISATION"@fr . . "Concrete"@en . . . . "Semiconducteurs III-V"@fr . "Semiconductors"@en . . "Ultrasonic for seismic"@en . . . "X-ray scattering"@en . . . . "Numerical simulation"@en . . "Optical properties"@en . "Molecular beam epitaxy"@en . "BETON ARME"@fr . "2D vertical homovalent singularity"@en . "Characterization"@en . "Chemical elements"@en . "Deposition processes"@en . "Conduction bands"@en . "Crystallinity"@en . "MODULE D'ELASTICITE"@fr . "TENEUR EN EAU"@fr . "MODELE NON LINEAIRE"@fr .