https://data.archives-ouvertes.fr/author/179672

https://data.archives-ouvertes.fr/author/179672

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http://xmlns.com/foaf/0.1/topic_interest Security
http://xmlns.com/foaf/0.1/topic_interest Fault tolerance
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http://xmlns.com/foaf/0.1/topic_interest Prediction
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http://xmlns.com/foaf/0.1/topic_interest Integrated systems
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http://xmlns.com/foaf/0.1/topic_interest Microprocessors
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http://xmlns.com/foaf/0.1/topic_interest Callbacks
http://xmlns.com/foaf/0.1/topic_interest I2C
http://xmlns.com/foaf/0.1/topic_interest Reliability assessment
http://xmlns.com/foaf/0.1/topic_interest Flip flops
http://xmlns.com/foaf/0.1/topic_interest Pattern generation
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http://xmlns.com/foaf/0.1/topic_interest Machine learning
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http://xmlns.com/foaf/0.1/topic_interest Systèmes embarqués
http://xmlns.com/foaf/0.1/topic_interest Optimization metrics
http://xmlns.com/foaf/0.1/topic_interest Encryption
http://xmlns.com/foaf/0.1/topic_interest Embedded test
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http://xmlns.com/foaf/0.1/topic_interest Data lifetime
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http://xmlns.com/foaf/0.1/topic_interest Automatic testing
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http://xmlns.com/foaf/0.1/topic_interest Retargeting
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http://xmlns.com/foaf/0.1/topic_interest Nonreliable system
http://xmlns.com/foaf/0.1/topic_interest Performance evaluation
http://xmlns.com/foaf/0.1/firstName Michele
http://xmlns.com/foaf/0.1/topic_interest RTL specifications
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http://xmlns.com/foaf/0.1/topic_interest Authentication
http://xmlns.com/foaf/0.1/topic_interest Embedded-system
http://xmlns.com/foaf/0.1/topic_interest Benchmark testing
http://xmlns.com/foaf/0.1/topic_interest Mixed-Signal Testing
http://xmlns.com/foaf/0.1/topic_interest Réseaux de scan reconfigurables
http://xmlns.com/foaf/0.1/topic_interest IEEE Standard P16871
http://xmlns.com/foaf/0.1/topic_interest Boundary-scan-standard
http://xmlns.com/foaf/0.1/topic_interest Accès sécurisé
http://xmlns.com/foaf/0.1/topic_interest Pipelined-processor
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http://xmlns.com/foaf/0.1/topic_interest RTL
http://xmlns.com/foaf/0.1/topic_interest Testing
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http://xmlns.com/foaf/0.1/topic_interest Embedded systems
http://xmlns.com/foaf/0.1/topic_interest Ciphers
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http://xmlns.com/foaf/0.1/topic_interest Fault diagnosis
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http://xmlns.com/foaf/0.1/topic_interest SJTAG
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http://xmlns.com/foaf/0.1/topic_interest RSN
http://xmlns.com/foaf/0.1/topic_interest LEON2
http://xmlns.com/foaf/0.1/topic_interest Error detection
http://xmlns.com/foaf/0.1/topic_interest HW/SW architecture
http://xmlns.com/foaf/0.1/name Michele Portolan
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http://xmlns.com/foaf/0.1/topic_interest Reconfigurable scan networks
http://xmlns.com/foaf/0.1/topic_interest IEEE P2654
http://xmlns.com/foaf/0.1/topic_interest Overall system reliability
http://xmlns.com/foaf/0.1/topic_interest Environnement de test automatisé
http://xmlns.com/foaf/0.1/topic_interest Test generation
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http://xmlns.com/foaf/0.1/topic_interest ICL
http://xmlns.com/foaf/0.1/topic_interest Fault tolerant computing
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http://xmlns.com/foaf/0.1/topic_interest Systèmes intégrés
https://aurehal.archives-ouvertes.fr/author/179672

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