https://data.archives-ouvertes.fr/author/1298716

https://data.archives-ouvertes.fr/author/1298716

http://xmlns.com/foaf/0.1/topic_interest Électronique de commande rapprochée
http://xmlns.com/foaf/0.1/topic_interest Active Gate Driver
http://xmlns.com/foaf/0.1/topic_interest On-line monitoring
http://xmlns.com/foaf/0.1/topic_interest Threshold voltage shift
http://xmlns.com/foaf/0.1/topic_interest Protection court-circuit
http://xmlns.com/foaf/0.1/topic_interest Grille
http://xmlns.com/foaf/0.1/name Vinnac Sébastien
http://xmlns.com/foaf/0.1/topic_interest Protection
http://xmlns.com/foaf/0.1/topic_interest Commande rapprochée modules SiC intégration CMOS protection court-circuit
http://xmlns.com/foaf/0.1/topic_interest MOSFET SiC
http://xmlns.com/foaf/0.1/topic_interest Wide bandgap devices
http://xmlns.com/foaf/0.1/topic_interest Court-circuit
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/spi.nano
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/spi.nrj
http://xmlns.com/foaf/0.1/topic_interest Gate-Aging
http://xmlns.com/foaf/0.1/interest https://data.archives-ouvertes.fr/subject/spi.tron
http://xmlns.com/foaf/0.1/topic_interest Hard Switching Fault
http://www.openarchives.org/ore/terms/isAggregatedBy https://data.archives-ouvertes.fr/author/sebastien-vinnac
http://xmlns.com/foaf/0.1/topic_interest P-GaN HEMT
http://xmlns.com/foaf/0.1/topic_interest Fuite de grille
http://www.w3.org/2002/07/owl#sameAs 0009-0002-9557-4228
http://xmlns.com/foaf/0.1/mbox_sha1sum b7b464d4d509f1fc4880619bf292d2f2
http://xmlns.com/foaf/0.1/topic_interest Vieillissement oxyde de grille
http://xmlns.com/foaf/0.1/topic_interest Commande rapprochée
http://xmlns.com/foaf/0.1/topic_interest Reliability
http://www.w3.org/2002/07/owl#sameAs Dm5UClEAAAAJ
http://xmlns.com/foaf/0.1/topic_interest Gate-Damage
http://xmlns.com/foaf/0.1/topic_interest Preconditioning protocol
http://xmlns.com/foaf/0.1/topic_interest Fiabilité
http://xmlns.com/foaf/0.1/topic_interest Parallel Operation
http://xmlns.com/foaf/0.1/topic_interest Silicon carbide SiC
http://xmlns.com/foaf/0.1/topic_interest Charge de grille
http://xmlns.com/foaf/0.1/topic_interest Gate driver
http://xmlns.com/foaf/0.1/topic_interest Intégration CMOS
http://xmlns.com/foaf/0.1/topic_interest Modules SiC
http://xmlns.com/foaf/0.1/topic_interest Schottky p-GaN transistors
http://xmlns.com/foaf/0.1/topic_interest Détection et protection
http://xmlns.com/foaf/0.1/topic_interest Transistor de puissance
http://xmlns.com/foaf/0.1/topic_interest Carbure de silicium
http://xmlns.com/foaf/0.1/topic_interest CMOS
http://xmlns.com/foaf/0.1/topic_interest Trapping
http://xmlns.com/foaf/0.1/familyName Sébastien
http://xmlns.com/foaf/0.1/topic_interest Hard-Switching stress
http://xmlns.com/foaf/0.1/topic_interest Robustness
http://xmlns.com/foaf/0.1/topic_interest Detection
http://xmlns.com/foaf/0.1/topic_interest Protection en surcharge courant
http://xmlns.com/foaf/0.1/topic_interest Fault detection
http://xmlns.com/foaf/0.1/topic_interest SiC MOSFET
http://xmlns.com/foaf/0.1/topic_interest Current Overload Current Protection
http://xmlns.com/foaf/0.1/topic_interest Cross-Conduction
http://xmlns.com/foaf/0.1/firstName Sébastien
http://xmlns.com/foaf/0.1/topic_interest Power MOSFET
http://xmlns.com/foaf/0.1/topic_interest Short-Circuit
http://xmlns.com/foaf/0.1/topic_interest HEMT GaN
http://xmlns.com/foaf/0.1/topic_interest Gate-Driver
http://xmlns.com/foaf/0.1/name Sébastien Vinnac
http://xmlns.com/foaf/0.1/firstName Vinnac
http://xmlns.com/foaf/0.1/topic_interest Health-Monitoring
http://xmlns.com/foaf/0.1/topic_interest Thermal runaway
http://www.w3.org/1999/02/22-rdf-syntax-ns#type http://xmlns.com/foaf/0.1/Person
http://xmlns.com/foaf/0.1/topic_interest Overvoltage stress
http://xmlns.com/foaf/0.1/topic_interest Optimsation temps-mort
http://xmlns.com/foaf/0.1/topic_interest MOSFET Carbure de Silicium
http://xmlns.com/foaf/0.1/familyName Vinnac
http://xmlns.com/foaf/0.1/topic_interest Monitoring
https://aurehal.archives-ouvertes.fr/author/1298716

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