dataHAL.science
Support
https://data.archives-ouvertes.fr/author/1298716
https://data.archives-ouvertes.fr/author/1298716
http://xmlns.com/foaf/0.1/topic_interest
Gate-Driver
http://xmlns.com/foaf/0.1/topic_interest
GaN Power Device
http://xmlns.com/foaf/0.1/topic_interest
Reliability and failure-modes
http://xmlns.com/foaf/0.1/name
Sébastien Vinnac
http://xmlns.com/foaf/0.1/topic_interest
Short-Circuit
http://xmlns.com/foaf/0.1/topic_interest
Power module a
http://xmlns.com/foaf/0.1/topic_interest
PCB layout
http://www.w3.org/2002/07/owl#sameAs
0009-0002-9557-4228
http://xmlns.com/foaf/0.1/topic_interest
Overvoltage stress
http://xmlns.com/foaf/0.1/topic_interest
Court-circuit
http://xmlns.com/foaf/0.1/topic_interest
Monitoring
http://xmlns.com/foaf/0.1/firstName
Sébastien
http://xmlns.com/foaf/0.1/topic_interest
MOSFET SiC
http://xmlns.com/foaf/0.1/topic_interest
Active Gate Driver
http://xmlns.com/foaf/0.1/topic_interest
On-line monitoring
http://xmlns.com/foaf/0.1/topic_interest
Protection court-circuit
http://xmlns.com/foaf/0.1/topic_interest
Hot Carrier Injection
http://xmlns.com/foaf/0.1/topic_interest
Functional stress
http://xmlns.com/foaf/0.1/topic_interest
MOSFET Carbure de Silicium
http://xmlns.com/foaf/0.1/topic_interest
HEMT GaN
http://xmlns.com/foaf/0.1/topic_interest
Gate driver
http://xmlns.com/foaf/0.1/topic_interest
Paralleled transistor
http://xmlns.com/foaf/0.1/topic_interest
Thermal runaway
http://xmlns.com/foaf/0.1/topic_interest
Silicon carbide SiC
http://xmlns.com/foaf/0.1/topic_interest
Power MOSFET
http://xmlns.com/foaf/0.1/topic_interest
Efficiency
http://xmlns.com/foaf/0.1/topic_interest
Électronique de commande rapprochée
http://xmlns.com/foaf/0.1/topic_interest
Current Over-Load Protection
http://xmlns.com/foaf/0.1/familyName
Vinnac
http://xmlns.com/foaf/0.1/topic_interest
Commande rapprochée modules SiC intégration CMOS protection court-circuit
http://xmlns.com/foaf/0.1/topic_interest
Short-Circuit & Protection
http://xmlns.com/foaf/0.1/topic_interest
CMOS
http://xmlns.com/foaf/0.1/topic_interest
Threshold voltage shift
http://xmlns.com/foaf/0.1/interest
https://data.archives-ouvertes.fr/subject/spi.tron
http://xmlns.com/foaf/0.1/topic_interest
Fault Under Load
http://xmlns.com/foaf/0.1/topic_interest
Amp
http://xmlns.com/foaf/0.1/topic_interest
Commande rapprochée
http://xmlns.com/foaf/0.1/topic_interest
Failure-Analysis
http://xmlns.com/foaf/0.1/topic_interest
Multilevel power converter
http://xmlns.com/foaf/0.1/topic_interest
Intégration CMOS
http://xmlns.com/foaf/0.1/topic_interest
Overload Operation
http://xmlns.com/foaf/0.1/topic_interest
HCI Degradation
http://xmlns.com/foaf/0.1/topic_interest
Robustness
http://xmlns.com/foaf/0.1/topic_interest
Low-voltage power GaN High-Electron-Mobility-Transistor reliability and failure-modes robustness functional stress aging mechanism drift mechanism charges trapping-detrapping 2DEG pinch-off short-circuit operation condition repetitive short-circuit operation condition
http://xmlns.com/foaf/0.1/topic_interest
Aging
http://xmlns.com/foaf/0.1/topic_interest
Fiabilité
http://xmlns.com/foaf/0.1/topic_interest
Gate oxide degradation
http://xmlns.com/foaf/0.1/topic_interest
Current Overload Current Protection
http://xmlns.com/foaf/0.1/interest
https://data.archives-ouvertes.fr/subject/spi.nano
http://xmlns.com/foaf/0.1/interest
https://data.archives-ouvertes.fr/subject/spi.nrj
http://xmlns.com/foaf/0.1/topic_interest
Short-Circuit &amp
http://xmlns.com/foaf/0.1/topic_interest
Degradation Mechanisms
http://xmlns.com/foaf/0.1/topic_interest
Vieillissement oxyde de grille
http://xmlns.com/foaf/0.1/topic_interest
Short-circuit operation condition
http://xmlns.com/foaf/0.1/topic_interest
P-GaN HEMT
http://xmlns.com/foaf/0.1/topic_interest
Charges trapping-detrapping
http://xmlns.com/foaf/0.1/topic_interest
Field-Plate
http://xmlns.com/foaf/0.1/topic_interest
Grille
http://xmlns.com/foaf/0.1/mbox_sha1sum
b7b464d4d509f1fc4880619bf292d2f2
http://www.w3.org/1999/02/22-rdf-syntax-ns#type
http://xmlns.com/foaf/0.1/Person
http://xmlns.com/foaf/0.1/topic_interest
Détection et protection
http://xmlns.com/foaf/0.1/topic_interest
Drift mechanism
http://xmlns.com/foaf/0.1/topic_interest
Wide bandgap devices
http://xmlns.com/foaf/0.1/topic_interest
SiC MOSFET
http://xmlns.com/foaf/0.1/topic_interest
Fault detection
http://xmlns.com/foaf/0.1/topic_interest
Flying capacitor
http://xmlns.com/foaf/0.1/topic_interest
Hard Switching Fault
http://xmlns.com/foaf/0.1/topic_interest
Schottky p-GaN transistors
http://xmlns.com/foaf/0.1/topic_interest
Repetitive short-circuit operation condition
http://xmlns.com/foaf/0.1/topic_interest
Power Device Aging
http://xmlns.com/foaf/0.1/topic_interest
Low-voltage power GaN High-Electron-Mobility-Transistor
http://xmlns.com/foaf/0.1/topic_interest
Hard-Switching stress
http://xmlns.com/foaf/0.1/topic_interest
Fuite de grille
http://xmlns.com/foaf/0.1/topic_interest
Protection en surcharge courant
http://xmlns.com/foaf/0.1/topic_interest
Health-Monitoring
http://xmlns.com/foaf/0.1/topic_interest
Trapping
http://xmlns.com/foaf/0.1/topic_interest
Architecture de gate-driver
http://xmlns.com/foaf/0.1/topic_interest
Robustness functional stress
http://xmlns.com/foaf/0.1/topic_interest
Cross-Conduction
http://xmlns.com/foaf/0.1/topic_interest
Failure-Mode
http://xmlns.com/foaf/0.1/topic_interest
Detection
http://xmlns.com/foaf/0.1/topic_interest
Carbure de silicium
http://xmlns.com/foaf/0.1/topic_interest
Protection
http://www.openarchives.org/ore/terms/isAggregatedBy
https://data.archives-ouvertes.fr/author/sebastien-vinnac
http://xmlns.com/foaf/0.1/topic_interest
Aging mechanism
http://xmlns.com/foaf/0.1/topic_interest
Reliability
http://xmlns.com/foaf/0.1/topic_interest
Transistor de puissance
http://xmlns.com/foaf/0.1/topic_interest
Gate-Damage
http://xmlns.com/foaf/0.1/topic_interest
Parallel Operation
http://xmlns.com/foaf/0.1/topic_interest
Physical Degradations
http://xmlns.com/foaf/0.1/topic_interest
Current sensing
http://xmlns.com/foaf/0.1/topic_interest
GaN HEMT
http://xmlns.com/foaf/0.1/topic_interest
Optimsation temps-mort
http://xmlns.com/foaf/0.1/topic_interest
Ageing
http://xmlns.com/foaf/0.1/topic_interest
Charge de grille
http://www.w3.org/2002/07/owl#sameAs
Dm5UClEAAAAJ
http://xmlns.com/foaf/0.1/topic_interest
Surveillance et Diagnostic
http://xmlns.com/foaf/0.1/topic_interest
Dérive du seuil Vgsth
http://xmlns.com/foaf/0.1/topic_interest
Modules SiC
http://xmlns.com/foaf/0.1/topic_interest
Preconditioning protocol
http://xmlns.com/foaf/0.1/topic_interest
2DEG pinch-off
http://xmlns.com/foaf/0.1/topic_interest
Gate-Aging
http://xmlns.com/foaf/0.1/topic_interest
Safety Design
http://xmlns.com/foaf/0.1/topic_interest
Health monitoring
https://aurehal.archives-ouvertes.fr/author/1298716
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